THREE NEW "HOW TO" BOOKLETS FROM KEITHLEY PROVIDE TEST AND MEASUREMENT
APPLICATION TIPS

CLEVELAND, OH -- August 6, 1993 -- Three informative new booklets from the
Test Instrumentation Group of Keithley Instruments, Inc. offer scientists
and engineers a series of application notes on a variety of test and
measurement instruments. Written by technical experts at Keithley, these
booklets provide invaluable "real life" information on how to simplify
test configurations, improve throughput, and reduce testing costs.

The "General Measurements" booklet includes 20 application notes. The
subjects covered range from techniques for locating short circuits in
printed circuit boards to measuring power line harmonics.

The second booklet, which includes eleven application notes, focuses on
"Semiconductor Measurements". The subjects of the notes include zener
diode characterization, parametric testing of packaged semiconductors,
measuring sweeps using multiple source-measure units, and a variety of
others.

The "Low Level Measurements" booklet offers six application notes on
subjects such as sources of measurement errors when measuring high
resistances, how to use a cryogenic liquid level sensor, and measuring the
resistivity of insulating materials.

Keithley Instruments, Inc. is a leading single source of advanced hardware
and software for test and measurement instrumentation and data acquisition
and control applications of scientists and engineers worldwide. Its
products and systems are found throughout the world in universities,
industrial research laboratories, engineering development departments,
quality control areas, and on production lines.

For free copies of any or all of these new Application Note booklets, call
1-216-248-0400 or 1-800-552-1115 or write to Keithley at 28775 Aurora
Road, Cleveland, Ohio 44139.

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